Variance reduction using wafer patterns in I_ddQ data

Improved wafer-level spatial analysis for I_DDQ limit setting

This paper proposes a new methodology for estimating the upper bound on the IDDQ of defect free chips by using wafer level spatial information. This can be used for IDDQ pass/fail limit setting. This methodology is validated using SEMATECH data. Such a methodology accounts for the change in IDDQ due to process variations across wafers and reduces false rejects resulting in yield loss. Typical s...

Analysis of Heart Rate Variability During Meditative and Non-Meditative State Using Analysis of Variance

In this paper the main objective is to quantify and compare the instantaneous value of heart rate for normal breathing patterns during Meditation and Non Meditation conditions. This paper involves Analysis of Variance (ANOVA) technique for the analysis of the heart rate variability patterns during the meditative and non meditative states. The analysis is divided into three stages i.e. data acqu...

Data mining for yield enhancement in semiconductor manufacturing and an empirical study

During wafer fabrication, process data, equipment data, and lot history will be automatically or semi-automatically recorded and accumulated in database for monitoring the process, diagnosing faults, and managing manufacturing. However, in high-tech industry such as semiconductor manufacturing, many factors that are interrelated affect the yield of fabricated wafers. Engineers who rely on perso...

Detection of bridging faults in logic resources of configurable FPGAs using I_DDQ

Planar and SPECT Monte Carlo acceleration using a variance reduction technique in I131 imaging

Background: Various variance reduction techniques such as forced detection (FD) have been implemented in Monte Carlo (MC) simulation of nuclear medicine in an effort to decrease the simulation time while keeping accuracy. However most of these techniques still result in very long MC simulation times for being implemented into routine use. Materials and Methods: Convolution-based force...